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Anne Köpke

Anne Köpke
Fon: +49 30 7001154-124
anne.koepke@may.berlin


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Test Probes

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There is no place for inaccuracies during testing, due to the small dimensions in electronic devices. It’s known from practice - how fast a slipping can lead to the destruction of an electronic device or of a complete entire device. MC offers the right test probe for each specific application:

Slim, spring-loaded stainless steel probes for finest applications 
Strong steel probes for robust using 
• Sharp probes and high-quality contact surfaces to penetrate oxidation layers   
IC - tip protection for secure contacting on ICs

Image
Description
Avail.
Price
Aufsteckprüfspitze, SPP4-S
Aufsteckprüfspitze, SPP4-S
Edelstahlspitze schwarz
Item No.: 24.0235-21
Aufsteckprüfspitze, SPP4-S
Aufsteckprüfspitze, SPP4-S
Edelstahlspitze rot
Item No.: 24.0235-22
Prüfspitz BT400; schwarz
Prüfspitz BT400; schwarz
Ø 2 mm-Edelstahlspitz
starre Ø 4 mm-Buchse
Item No.: 66.9390-21
Prüfspitz BT400; rot
Prüfspitz BT400; rot
Ø 2 mm-Edelstahlspitz
starre Ø 4 mm-Buchse
Item No.: 66.9390-22
Prüfspitz BT400; blau
Prüfspitz BT400; blau
Ø 2 mm-Edelstahlspitz
starre Ø 4 mm-Buchse
Item No.: 66.9390-23
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